Symposium / 22. Juli 2022
International Symposium on Failure Analysis and Material Testing - FAMT 2022
July 22, 2022, 7:30 h to 12:30 h CEST
Fraunhofer IISB, Erlangen, Germany, and online via Zoom
The design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet international quality standards. Detection and classification of nanometer-sized material defects require characterization methods with a resolution in the nanometer range.
This symposium gathers the professionals from the electronic industry to discuss innovative testing methods at nanoscale and tools for physical failure analysis of the future.