Dr. Christian Kranert, group manager for crystal and wafer metrology within the IISB's materials department, has been actively working with SEMI for many years. Particularly, he is leading several standardization task forces of the Compound Semiconductor Materials Technical Committee, for which he also serves as co-chair. Dr. Kranert helps to solve the complex problem of defining industry standards for 4H-SiC metrology. For example, he drove two SEMI Standards (M91 and M93) for defect quantification with XRT test methods to publication. 
The continuous establishment of SEMI Standards drives the worldwide alignment of processes in WBG semiconductor manufacturing and increases efficiency in the microelectronics industry.