FAMT 2022

July 22, 2022, 7:30 h to 12:30 h CEST
Fraunhofer IISB, Erlangen, Germany, and online via Zoom

The design complexity of electronic components and the heterogeneity of new materials constantly increase with decreasing device sizes. New-engineered products need to secure a high level of reliability, sustainability, and longevity to meet international quality standards. Detection and classification of nanometer-sized material defects require characterization methods with a resolution in the nanometer range.

This symposium gathers the professionals from the electronic industry to discuss innovative testing methods at nanoscale and tools for physical failure analysis of the future.

Further information