Exhibition and Conference  /  06. Mai 2025  -  08. Mai 2025

PCIM 2025 – Power electronics, intelligent motion, renewable energy, and energy management

The PCIM Expo & Conference is the leading international exhibition and conference for power electronics, intelligent motion, renewable energy, and energy management. This is the place where representatives from research and industry come together, where trends and developments are presented to the public for the first time, and where the entire value chain is covered – all the way from components to intelligent systems.

Attendees of the PCIM Expo & Conference are experts and decision makers mainly from research and development, technology, production and construction, purchasing, and the executive management.

As a highly specialized exhibition, the PCIM Expo is distinguished by an intensive working atmosphere. Visitors attending the exhibition gather latest information about trends and developments, exchange information and experience, obtain a market overview, and establish and maintain business relations.
 

At the PCIM 2025, Fraunhofer IISB will present the broad spectrum of its activities – from semiconductor material and devices to system development.

Visit us at the exhibition (booth 6-260) ...

... and meet us at the conference:

Ultracompact Symmetrical Medium Voltage DC-DC Converter for Electrified Aircraft
by Malavika Santhosh Kumar et al., PP066 in poster session, section "Railway and Avionic Applications", May 6, 12:45 - 14:15 h, Hall 10.1

Machine Learning and Digital Twins for RUL Prediction of DC Semiconductor Circuit Breakers
by Lena Köhler et al., oral session "Condition Health Monitoring", May 6, 14:50 - 15:10 h, stage: München 1

Transient Junction Temperature Measurement Error of SiC MOSFETs in Power Cycling - A Parameter Study
by Jakob Breuer et al., PP113 in poster session, section "Reliability Testing", May 6, 15:30 - 17:00 h, Foyer

Thermally Stable Operating Point for SiC MOSFETs in the Power Cycling Test
by Fabian Dresel et al., PP115 in poster session, section "Reliability Testing", May 6, 15:30 - 17:00 h, Foyer

Influence of SiC MOSFET Device Parameters on Zero-Voltage Switching Losses
Martin März et al., PP146 in poster session, section "SiC Devices", May 7, 12:45 - 14:15 h, Hall 10.1

IISB2 Topology for 48 V to 1 V Point of Load Applications
by Stefan Zeltner et al., oral session "Server Power Supplies", May 7, 14:30 - 14:50 h, stage: Mailand